Reliability Engineering
- MIL-STD-785B Reliability Program Plan
- Failure Analysis
- Spacecraft On-Orbit Anomalies Resolution (SOAR Database Analysis)
- Spacecraft On-orbit Reliability prediction using historical spacecraft lifetimes
- Launch Vehicle Reliability
- New Design- RBD Method
- Heritage Based
- Binomial using historical launch success ratio
- Mission Completion Success Probability Predictions
- Confidence Level Indicators using heritage and test data of piece parts
- MIL-HDBK-217 Predictions (using computer program RELCALC for Windows)
- Reliability Assessment (Reliability Block Diagram - RBD Method)
- Redundancy Calculations
- Availability Requirements
- Analytical Demonstration of Instantaneous and Steady State A0
- Statistical Data - Weibull Analysis for Reliability Assessment
- NASA HARP (Hybrid Automated Reliability Predictor) Computer Program for State Transition Machines
- Repairable and Non-Repairable Systems
- Spares Requirements Determination
- Maintainability Analysis
- R, MTBF, MTTR and MDT Calculations
- Mechanical Reliability Prediction
- Non-electronics Parts Data Sources: LC78-1, NONOP-1, NPRD
Electrical Stress Analysis
- Stress Ratio
- Derated Stress - Derating Guidelines
- MIL-STD-975 (NASA)
- USAF AS-4613
- NAVMAT P4855-1
- Ford Aerospace Radiation Effects
- Applied Stress Prediction
- Operating points based on circuit analysis/performance
- Analog and Digital ICs
- Linear and Discrete Parts
- Electronic spreadsheet format
- Voltage, Current, Fan-in/Fan-out, Temperature derating
Worst Case Analysis (WCA)
- MIL-STD-785B, Task 206
- Extreme Value Analysis (EVA)
- RSS (Root-Sum-Squared)
- Monte Carlo
- Parts Parameter Variance Data Base (PPVDB)
- Variance with Aging, Temperature and Radiation Effects
- SPICE PARTS Modeling
- EVA, typical nominal min/max
- Worst case, Worst-On-Worst (WOW) ? 6 ? Min/Max
- Circuit Analysis-Analog and Digital
- Circuit Analysis-Analog and Digital
- PSPICE PC
- Interactive-Graphics (IGSPICE)
- DC and Linear
- Transient Analysis
- Nominal Circuit Performance
- Worst Case Performance
- Sensitivity Analysis
- Ionizing Radiation Sources
Radiation Effects
- Total Ionizing Dose, Neutron Fluence
- Transient Radiation Effects on Electronics (TREE)
- Electro-Magnetic Pulse (EMP)
- Single Event Upset (SEU)
Failure Mode Effects and Criticality Analysis (FMECA)
- Safety-Of-Life "Man-Rated" Circuits Two (2) Failure Tolerance
- Mission Critical Functions
- Box Connector Pin Level
- Critical Component Level as required
- Single Thread End-to-End Diagrams
- Elimination of Single Point failures (SPF)
- Critical Items Lists (CIL)
- Testing Criteria, Failure Detection Methods, Compensating Provisions
- MIL-STD-1629, NSTS 22206, MIL-STD-1543 compliant
- Electronic Spreadsheet Method
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